Effect of Ti4+ substitution in copper ferrite: An analogous study

Two systems of copper ferrites, Cu1-xTixFe2O4 (system 1) and Cu1+xTixFe2-2xO4 (system 2), were analogously investigated for 0 less than or equal to x less than or equal to 0.4. In addition to X-ray and IR spectra investigations, the study of the microstructure, microhardness and the d.c. conductivity of the two systems was achieved. In terms of the X-ray data and the IR spectra, two different cation distributions were proposed for system 1 and system 2, respectively. For system 1, the lattice constant was found to be independent of x, while it increases with x for system 2. A drop in the grain diameter from 45 mu m to about 16 mu m is associated with a change of x from 0 to 0.4 for system 1, whilst the grain diameter for system 2 seems to be independent of composition. The general trends for the microhardness and the d.c. conductivity were also taken into consideration.