In this paper, two sector beam scanning approaches (BSAs) based on element position perturbations (EPPs) in the azimuth plane are introduced. In EPP-BSA, the elements’ excitations are kept constant and the elements’ positions in the direction normal to the array line are changed according to a predetermined EPP pattern. The magnitude and repetition rate of the selected EPP pattern determines the steering angle of the main beam. However, EPP-BSA results in a wide scanning range with a significant increase in the side lobe level (SLL). To mitigate this drawback, a reduction in the SLL of the array pattern is firstly performed using the single convolution/genetic algorithm (SC/GA) technique and then perturbing the elements’ positions in the azimuth plane. This combination between SLL reduction and EPP-BSA (SLL/EPP-BSA) results in a smaller scanning range with a relatively constant half power beamwidth (HPBW) and a much lower SLL. In addition, keeping the synthesized excitation coefficients constant without adding progressive phase shifters facilitates the manufacturing process and reduces the cost of the feeding network. Furthermore, a planar antenna array thinning approach is proposed to realize the EPP-BSA. The results are realized using the computer simulation technology (CST) microwave studio software package, which provides users with an optimized modeling environment and results in realizable and realistic designs.