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EXAFS analysis of nanocrystallization process in Fe85Zr7B6Cu2 alloys by using cumulant method
Faculty
Science
Year:
2005
Type of Publication:
Article
Pages:
71-77
Authors:
Swilem, Y, Sobczak, E, Nietubyc, R, Slawska-Waniewska, A
DOI:
10.1016/j.physb.2005.03.037
Journal:
PHYSICA B-CONDENSED MATTER ELSEVIER SCIENCE BV
Volume:
364
Research Area:
Physics
ISSN
ISI:000230253100008
Keywords :
X-ray spectroscopy, nanocrystalline alloys, amorphous alloys, grain boundaries
Abstract:
The cumulant method is a model-independent technique based on the expansion of extended X-ray absorption fine structure (EXAFS) amplitudes and phases as a series of cumulants of the interatomic distance distribution. Results show evidence of simple grain boundary formed its amorphous-crystal interface region around BCC Fe nanocrystals. This interface region initially growth along with the growth of the Fe nanocrystals. However, in the latter stage of nanocrystallization, additional contribution of statically disordered interface is formed in nanograin boundaries hindering the grain growth. The disordered interfacial regions can help to explain nanocrystallization phenomenon of Fe85Zr7B6Cu2 alloys. (c) 2005 Elsevier B.V. All rights reserved.
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