X-ray and IR analysis of Cu-Si ferrite

Polycrystalline soft ferrite, Cu1+xSixFe2-2xO4 (x = 0.0, 0.05, 0.1, 0.15, 0.2 and 0.3) were prepared by standard ceramic technique. The X-ray analysis confirmed the single phase formation of the samples up to x = 0.1 beside a second phase for x >= 0.15. The lattice parameter was found to decrease with composition(x), which is attributed to ionic size difference of cations involved. The bulk density measurements shows two different behavior for x < > 0.15. The IR spectra of Cu-Si ferrite system have been analyzed in the frequency range 200-1200cm(-1). It revealed two prominent bands nu(1) and nu(2) which are assigned to tetrahedral and octahedral metal complexes, respectively. The position of the highest frequency band is around 575 cm(-1) while the lower frequency band is around 400 cm-1. (c) 2006 Elsevier Ltd. All rights reserved.