Short circuit test-complete analysis for the dense plasma focus

Faculty Engineering Year: 2011
Type of Publication: ZU Hosted Pages:
Authors:
Mohammed Ismail Abdelaziz Mohamed
Journal: Plasma Science (ICOPS), 2011 Abstracts IEEE International Conference on IEEE Volume:
Keywords : Short circuit test-complete analysis , , dense plasma    
Abstract:
The static impedance of the capacitor bank and external connections of the dense plasma focus has a great importance in the device performance1, 2. Previous works used approach formulas to find the machine static parameters3. In this pa
    
     
 
       

Author Related Publications

  • Mohammed Ismail Abdelaziz Mohamed, "Measurement and processing of fast pulsed discharge current in plasma focus machines", Springer US, 2012 More
  • Mohammed Ismail Abdelaziz Mohamed, "Current sheet axial dynamics of 2.5-kj ksu-dpf under high-pressure regime", IEEE, 2012 More
  • Mohammed Ismail Abdelaziz Mohamed, "Deuteron beam characteristics of 2.5 kJ KSU-DPF as a high inductance dense plasma focus machine", IEEE, 2013 More
  • Mohammed Ismail Abdelaziz Mohamed, "Preliminary Results of Kansas State University Dense Plasma Focus", IEEE, 2012 More
  • Mohammed Ismail Abdelaziz Mohamed, "Kansas State University Dense Plasma Focus (KSU-DPF) initial neutron results", IEEE, 2011 More

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