Short circuit test-complete analysis for the dense plasma focus

Faculty	Engineering	Year:	2011
Type of Publication:	ZU Hosted	Pages:
Authors:	Mohammed Ismail Abdelaziz Mohamed Staff Zu Site Abstract In Staff Site
Journal:	Plasma Science (ICOPS), 2011 Abstracts IEEE International Conference on IEEE	Volume:

Keywords :	Short circuit test-complete analysis , , dense plasma
Abstract:	The static impedance of the capacitor bank and external connections of the dense plasma focus has a great importance in the device performance1, 2. Previous works used approach formulas to find the machine static parameters3. In this pa

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