Optical characterization of Se90S10-xCdx thin films

Faculty Science Year: 2013
Type of Publication: ZU Hosted Pages:
Authors:
Journal: Journal of Applied Physics www.iosrjournals.org Volume:
Keywords : Optical characterization , Se90S10-xCdx thin films    
Abstract:
Abstract: Thin films of different thicknesses of Se90S10-xCdx, (x=0 and 5) were deposited by thermal evaporation technique onto glass substrates. X-ray diffraction patterns (XRD), differential thermal analysis (DTA) and energy dispersive X-
   
     
 
       

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