THE BAYES RISK FOR THE PARAMETERS OF DOUBLY TRUNCATED WEIBULL DISTRIBUTION

Faculty	Commerce	Year:	1993
Type of Publication:	Article	Pages:	2189-2192
Authors:	SHALABY, OA	DOI:	10.1016/0026-2714(93)90057-6
Journal:	MICROELECTRONICS AND RELIABILITY PERGAMON-ELSEVIER SCIENCE LTD	Volume:	33
Research Area:	Engineering; Science \& Technology - Other Topics; Physics	ISSN	ISI:A1993MJ35100002
Keywords :	, BAYES RISK , , PARAMETERS , DOUBLY TRUNCATED WEIBULL
Abstract:	This paper gives the exact distribution of the accumulated observed times from the doubly truncated Weibull distribution. This distribution is very important in the theory of Bayesian risk for the unknown parameters of the present distribution.
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