STUDY OF OPTICAL THIN SEMICONDUCTOR FILMS

Faculty	Science	Year:	1992
Type of Publication:	Theses	Pages:
Authors:	Ahmed Saeed El Sayed Hassanien
		BibID	10282290
Keywords :	Thin Semiconductor Films
Abstract:	Film thicknedd have been determined using multiplebeam Fizeau fringes at reflection. The thickness of the films ranged between 600Å and 1800Å. X-ray diffraction patterns reveal that the bulk and film samples are polycrystalline. Optical transmission and r

PDF